مؤتمر
High sigma measurement of random threshold voltage variation in 14nm Logic FinFET technology
| العنوان: | High sigma measurement of random threshold voltage variation in 14nm Logic FinFET technology |
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| المؤلفون: | Giles, M. D., Arkali Radhakrishna, N., Becher, D., Kornfeld, A., Maurice, K., Mudanai, S., Natarajan, S., Newman, P., Packan, P., Rakshit, T. |
| المصدر: | 2015 Symposium on VLSI Technology (VLSI Technology) VLSI Technology (VLSI Technology), 2015 Symposium on. :T150-T151 Jun, 2015 |
| Relation: | 2015 Symposium on VLSI Technology |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9784863485013 |
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| تدمد: | 07431562 21589682 |
| DOI: | 10.1109/VLSIT.2015.7223657 |