دورية أكاديمية
Hot hole stress induced leakage current (SILC) transient in tunnel oxides
| العنوان: | Hot hole stress induced leakage current (SILC) transient in tunnel oxides |
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| المؤلفون: | Tahui Wang, Nian-Kai Zous, Jia-Long Lai, Chimoon Huang |
| المصدر: | IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 19(11):411-413 Nov, 1998 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 07413106 15580563 |
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| DOI: | 10.1109/55.728896 |