مؤتمر
Effect of the resistance of open and short faults on the production testing of MCML gates
| العنوان: | Effect of the resistance of open and short faults on the production testing of MCML gates |
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| المؤلفون: | Mohie El-Din, R., Emara, A.S., Amer, S.H., Fouad, M.M., Madian, A.H., Amer, H.H., Abdelhalim, M.B., Draz, H.H. |
| المصدر: | 2014 14th Biennial Baltic Electronic Conference (BEC) Electronic Conference (BEC), 2014 14th Biennial Baltic. :81-84 Oct, 2014 |
| Relation: | 2014 14th Biennial Baltic Electronic Conference (BEC) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781467395397 9781467395380 |
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| تدمد: | 17363705 2382820X |
| DOI: | 10.1109/BEC.2014.7320561 |