دورية أكاديمية
Thermal Characterization Using Optical Methods of AlGaN/GaN HEMTs on SiC Substrate in RF Operating Conditions
| العنوان: | Thermal Characterization Using Optical Methods of AlGaN/GaN HEMTs on SiC Substrate in RF Operating Conditions |
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| المؤلفون: | Baczkowski, L., Jacquet, J., Jardel, O., Gaquiere, C., Moreau, M., Carisetti, D., Brunel, L., Vouzelaud, F., Mancuso, Y. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 62(12):3992-3998 Dec, 2015 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2015.2493204 |