مؤتمر
Low voltage IMD-TDDB lifetime model for advanced future logic technology nodes
العنوان: | Low voltage IMD-TDDB lifetime model for advanced future logic technology nodes |
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المؤلفون: | Jeong, Tae-Young, Kim, Jinseok, Jo, Yunhee, Tak, Kyuho, Lee, Miji, Windu, Sari, Choi, Hyunjun, Choi, Yuri, Jo, Yunkyung, Pae, Sangwoo, Park, Jongwoo |
المصدر: | 2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM) Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM), 2015 IEEE International. :299-302 May, 2015 |
Relation: | 2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781467373562 9781467373555 |
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تدمد: | 2380632X 23806338 |
DOI: | 10.1109/IITC-MAM.2015.7325586 |