Low voltage IMD-TDDB lifetime model for advanced future logic technology nodes

التفاصيل البيبلوغرافية
العنوان: Low voltage IMD-TDDB lifetime model for advanced future logic technology nodes
المؤلفون: Jeong, Tae-Young, Kim, Jinseok, Jo, Yunhee, Tak, Kyuho, Lee, Miji, Windu, Sari, Choi, Hyunjun, Choi, Yuri, Jo, Yunkyung, Pae, Sangwoo, Park, Jongwoo
المصدر: 2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM) Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM), 2015 IEEE International. :299-302 May, 2015
Relation: 2015 IEEE International Interconnect Technology Conference and 2015 IEEE Materials for Advanced Metallization Conference (IITC/MAM)
قاعدة البيانات: IEEE Xplore Digital Library