مؤتمر
ELDRS Characterization up to 300 Krad of Texas Instruments High Speed Amplifiers, LM7171 and LM6172
العنوان: | ELDRS Characterization up to 300 Krad of Texas Instruments High Speed Amplifiers, LM7171 and LM6172 |
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المؤلفون: | Kruckmeyer, Kirby, Trinh, Thang |
المصدر: | 2015 IEEE Radiation Effects Data Workshop (REDW) Radiation Effects Data Workshop (REDW), 2015 IEEE. :1-5 Jul, 2015 |
Relation: | 2015 IEEE Radiation Effects Data Workshop (REDW) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781467376419 |
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DOI: | 10.1109/REDW.2015.7336707 |