مؤتمر
ELDRS Characterization up to 300 Krad of Texas Instruments High Speed Amplifiers, LM7171 and LM6172
| العنوان: | ELDRS Characterization up to 300 Krad of Texas Instruments High Speed Amplifiers, LM7171 and LM6172 |
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| المؤلفون: | Kruckmeyer, Kirby, Trinh, Thang |
| المصدر: | 2015 IEEE Radiation Effects Data Workshop (REDW) Radiation Effects Data Workshop (REDW), 2015 IEEE. :1-5 Jul, 2015 |
| Relation: | 2015 IEEE Radiation Effects Data Workshop (REDW) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781467376419 |
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| DOI: | 10.1109/REDW.2015.7336707 |