مؤتمر
Scanning microwave microscopy for nanoscale characterization of semiconductors: De-embedding reflection contact mode measurements
| العنوان: | Scanning microwave microscopy for nanoscale characterization of semiconductors: De-embedding reflection contact mode measurements |
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| المؤلفون: | Michalas, L., Lucibello, A., Badino, G., Joseph, C.H., Brinciotti, E., Kienberger, F., Proietti, E., Marcelli, R. |
| المصدر: | 2015 European Microwave Conference (EuMC) Microwave Conference (EuMC), 2015 European. :159-162 Sep, 2015 |
| Relation: | 2015 European Microwave Conference (EuMC 2015) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9782874870392 |
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| DOI: | 10.1109/EuMC.2015.7345724 |