Delay design-for-testability for functional RTL circuits

التفاصيل البيبلوغرافية
العنوان: Delay design-for-testability for functional RTL circuits
المؤلفون: Shaheen, Ateeq-Ur-Rehman, Hussin, Fawnizu Azmadi, Hamid, Nor Hisham
المصدر: 2015 7th International Conference on Information Technology and Electrical Engineering (ICITEE) Information Technology and Electrical Engineering (ICITEE), 2015 7th International Conference on. :494-499 Oct, 2015
Relation: 2015 7th International Conference on Information Technology and Electrical Engineering (ICITEE)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781467378635
9781467378628
DOI:10.1109/ICITEED.2015.7408997