مؤتمر
Delay design-for-testability for functional RTL circuits
العنوان: | Delay design-for-testability for functional RTL circuits |
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المؤلفون: | Shaheen, Ateeq-Ur-Rehman, Hussin, Fawnizu Azmadi, Hamid, Nor Hisham |
المصدر: | 2015 7th International Conference on Information Technology and Electrical Engineering (ICITEE) Information Technology and Electrical Engineering (ICITEE), 2015 7th International Conference on. :494-499 Oct, 2015 |
Relation: | 2015 7th International Conference on Information Technology and Electrical Engineering (ICITEE) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781467378635 9781467378628 |
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DOI: | 10.1109/ICITEED.2015.7408997 |