Solving the paradox of the inconsistent size dependence of thermal stability at device and chip-level in perpendicular STT-MRAM

التفاصيل البيبلوغرافية
العنوان: Solving the paradox of the inconsistent size dependence of thermal stability at device and chip-level in perpendicular STT-MRAM
المؤلفون: Thomas, Luc, Jan, Guenole, Le, Son, Lee, Yuan-Jen, Liu, Huanlong, Zhu, Jian, Serrano-Guisan, Santiago, Tong, Ru-Ying, Pi, Keyu, Shen, Dongna, He, Renren, Haq, Jesmin, Teng, Zhongjian, Annapragada, Rao, Lam, Vinh, Wang, Yu-Jen, Zhong, Tom, Torng, Terry, Wang, Po-Kang
المصدر: 2015 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2015 IEEE International. :26.4.1-26.4.4 Dec, 2015
Relation: 2015 IEEE International Electron Devices Meeting (IEDM)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781467398947
9781467398930
تدمد:2156017X
DOI:10.1109/IEDM.2015.7409773