التفاصيل البيبلوغرافية
| العنوان: |
A Methodology for Thermal Characterization Abstraction of Integrated Opto-Electronic Layouts |
| المؤلفون: |
Schlitt, Lawrence M., Kalla, Priyank, Blair, Steve |
| المصدر: |
2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID) VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID), 2016 29th International Conference on. :270-275 Jan, 2016 |
| Relation: |
2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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