مؤتمر
A study of dry stiction phenomenon in MEMS using a computational stochastic multi-scale methodology
العنوان: | A study of dry stiction phenomenon in MEMS using a computational stochastic multi-scale methodology |
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المؤلفون: | Hoang, T.-V., Wu, L., Paquay, S., Golinval, J.-C., Arnst, M., Noels, L. |
المصدر: | 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2016 17th International Conference on. :1-4 Apr, 2016 |
Relation: | 2016 17th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781509021062 9781509021208 |
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DOI: | 10.1109/EuroSimE.2016.7463333 |