مؤتمر
Non-contact electrical characterization of GaN, SiC and AlGaN/GaN for device applications
العنوان: | Non-contact electrical characterization of GaN, SiC and AlGaN/GaN for device applications |
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المؤلفون: | Findlay, A., Lagowski, J., Wilson, M., Savtchouk, A., Hillard, B. |
المصدر: | 2016 China Semiconductor Technology International Conference (CSTIC) Semiconductor Technology International Conference (CSTIC), 2016 China. :1-3 Mar, 2016 |
Relation: | 2016 China Semiconductor Technology International Conference (CSTIC) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781467388047 9781467388030 |
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DOI: | 10.1109/CSTIC.2016.7464065 |