Non-contact electrical characterization of GaN, SiC and AlGaN/GaN for device applications

التفاصيل البيبلوغرافية
العنوان: Non-contact electrical characterization of GaN, SiC and AlGaN/GaN for device applications
المؤلفون: Findlay, A., Lagowski, J., Wilson, M., Savtchouk, A., Hillard, B.
المصدر: 2016 China Semiconductor Technology International Conference (CSTIC) Semiconductor Technology International Conference (CSTIC), 2016 China. :1-3 Mar, 2016
Relation: 2016 China Semiconductor Technology International Conference (CSTIC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781467388047
9781467388030
DOI:10.1109/CSTIC.2016.7464065