مؤتمر
Application of the Eyring Model to capacitor aging data
العنوان: | Application of the Eyring Model to capacitor aging data |
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المؤلفون: | Endicott, H. S., Hatch, B. D., Sohmer, R. G. |
المصدر: | Annual Report 1962 Conference on Electrical Insulation Electrical Insulation, Annual Report 1962 Conference on. :47-50 Oct, 1962 |
Relation: | Annual Report 1962 Conference on Electrical Insulation |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781509031184 |
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DOI: | 10.1109/EIC.1962.7466672 |