دورية أكاديمية
Bitcell-Based Design of On-Chip Process Variability Monitors for Sub-28 nm Memories
| العنوان: | Bitcell-Based Design of On-Chip Process Variability Monitors for Sub-28 nm Memories |
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| المؤلفون: | Gupta, S., Monzel, C., Reed, D.S., Zhang, Y., Winter, M., Buer, M. |
| المصدر: | IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 63(7):1014-1022 Jul, 2016 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 15498328 15580806 |
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| DOI: | 10.1109/TCSI.2016.2556120 |