A novel bottom up fill mechanism for the metallization of advanced node copper interconnects

التفاصيل البيبلوغرافية
العنوان: A novel bottom up fill mechanism for the metallization of advanced node copper interconnects
المؤلفون: Mevellec, V., Thiam, M., Suhr, D., Religieux, L., Blondeau, P., Chaumont, J.B., Raynal, F.
المصدر: 2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC) Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC), 2016 IEEE International. :183-185 May, 2016
Relation: 2016 IEEE International Interconnect Technology Conference / Advanced Metallization Conference (IITC/AMC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781509003860
9781509003853
تدمد:23806338
DOI:10.1109/IITC-AMC.2016.7507725