Millimeter-wave six-port IQ demodulator in 65 nm SOI CMOS technology

التفاصيل البيبلوغرافية
العنوان: Millimeter-wave six-port IQ demodulator in 65 nm SOI CMOS technology
المؤلفون: Haddadi, Kamel, Loyez, Christophe
المصدر: 2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings Instrumentation and Measurement Technology Conference Proceedings (I2MTC), 2016 IEEE International. :1-5 May, 2016
Relation: 2016 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781467392204
DOI:10.1109/I2MTC.2016.7520391