مؤتمر
Quantitative photoelastic characterization of residual strain and its correlation with dislocation density profile in semi-insulating LEC-grown GaAs wafers
| العنوان: | Quantitative photoelastic characterization of residual strain and its correlation with dislocation density profile in semi-insulating LEC-grown GaAs wafers |
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| المؤلفون: | Yamada, M., Fukuzawa, M., Kimura, N., Kaminaka, K., Yokogawa, M. |
| المصدر: | Proceedings of the 7th Conference on Semi-insulating III-V Materials, Semi-Insulating III-V Materials, 1992 Proceedings of the 7th Conference on. :201-210 1992 |
| Relation: | Proceedings of the 7th Conference on Semi-insulating III-V Materials |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0750302429 9780750302425 |
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| DOI: | 10.1109/SIM.1992.752700 |