مؤتمر
Case study of flash memory failure analysis for page erase fail
| العنوان: | Case study of flash memory failure analysis for page erase fail |
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| المؤلفون: | Guo, M., Masuda, M., Che, Y., Qi, C. Y., Wang, X. Z., Li, X. C., Chen, R., Di, H. R., Shan, L. |
| المصدر: | 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2016 IEEE 23rd International Symposium on the. :29-32 Jul, 2016 |
| Relation: | 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781467382595 9781467382588 |
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| تدمد: | 19461550 |
| DOI: | 10.1109/IPFA.2016.7564241 |