مؤتمر
Field-dependent degradation mechanisms in GaN-based HEMTs
| العنوان: | Field-dependent degradation mechanisms in GaN-based HEMTs |
|---|---|
| المؤلفون: | Meneghini, M., Meneghesso, G., Rossetto, I., Bartholomeus, J., Rampazzo, F., De Santi, C., Bisi, D., Zanoni, E. |
| المصدر: | 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2016 IEEE 23rd International Symposium on the. :77-80 Jul, 2016 |
| Relation: | 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781467382595 9781467382588 |
|---|---|
| تدمد: | 19461550 |
| DOI: | 10.1109/IPFA.2016.7564252 |