التفاصيل البيبلوغرافية
| العنوان: |
Measurements and TCAD simulations of bulk and surface radiation damage effects in silicon detectors |
| المؤلفون: |
Moscatelli, F., Maccagnani, P., Passeri, D., Bilei, G.M., Servoli, L., Morozzi, A., Dalla Betta, G.-F., Mendicino, R., Boscardin, M., Zorzi, N. |
| المصدر: |
2015 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2015 IEEE. :1-6 Oct, 2015 |
| Relation: |
2015 IEEE Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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