التفاصيل البيبلوغرافية
| العنوان: |
S-parameter based device-level C-V measurement of p-i-n single-drift IMPATT diode for millimeter-wave applications |
| المؤلفون: |
Zhang, Wogong, Oehme, Michael, Kostecki, Konrad, Matthies, Klaus, Stefani, Viktor, Raju, Ashraful I., Noll, Daniel, Srinivasan, V.S. Senthil, Korner, Roman, Kasper, Erich, Schulze, Jorg |
| المصدر: |
2016 IEEE MTT-S International Wireless Symposium (IWS) Wireless Symposium (IWS), 2016 IEEE MTT-S International. :1-4 Mar, 2016 |
| Relation: |
2016 IEEE MTT-S International Wireless Symposium (IWS) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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