دورية أكاديمية
Low-frequency noise spectroscopy of polycrystalline silicon thin-film transistors
العنوان: | Low-frequency noise spectroscopy of polycrystalline silicon thin-film transistors |
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المؤلفون: | Angelis, C.T., Dimitriadis, C.A., Brini, J., Kamarinos, G., Gueorguiev, V.K., Ivanov, T.E. |
المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 46(5):968-974 May, 1999 |
قاعدة البيانات: | IEEE Xplore Digital Library |
تدمد: | 00189383 15579646 |
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DOI: | 10.1109/16.760405 |