مؤتمر
Bulk and surface effects of hydrogen treatment on Al/Ti-gate AlGaAs-GaAs power HFETs
| العنوان: | Bulk and surface effects of hydrogen treatment on Al/Ti-gate AlGaAs-GaAs power HFETs |
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| المؤلفون: | Gaddi, R., Menozzi, R., Dieci, D., Lanzieri, C., Meneghesso, G., Canali, C., Zanoni, E. |
| المصدر: | 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) Reliability physics Reliability Physics Symposium Proceedings, 1999. 37th Annual. 1999 IEEE International. :110-115 1999 |
| Relation: | 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780352203 9780780352209 |
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| DOI: | 10.1109/RELPHY.1999.761601 |