مؤتمر
Low voltage stress-induced-leakage-current in ultrathin gate oxides
| العنوان: | Low voltage stress-induced-leakage-current in ultrathin gate oxides |
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| المؤلفون: | Nicollian, P.E., Rodder, M., Grider, D.T., Chen, P., Wallace, R.M., Hattangady, S.V. |
| المصدر: | 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) Reliability physics Reliability Physics Symposium Proceedings, 1999. 37th Annual. 1999 IEEE International. :400-404 1999 |
| Relation: | 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780352203 9780780352209 |
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| DOI: | 10.1109/RELPHY.1999.761646 |