مؤتمر
Characterization of silicon direct bonding methodology for high performance IGBT
العنوان: | Characterization of silicon direct bonding methodology for high performance IGBT |
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المؤلفون: | Tae Hoon Kim, Chong Man Yun, Soo Seong Kim, Hyung Woo Jang |
المصدر: | 11th International Symposium on Power Semiconductor Devices and ICs. ISPSD'99 Proceedings (Cat. No.99CH36312) Power semiconductor devices and ICs Power Semiconductor Devices and ICs, 1999. ISPSD '99. Proceedings., The 11th International Symposium on. :185-188 1999 |
Relation: | 11th International Symposium on Power Semiconductor Devices and ICs. ISPSD '99 |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0780352904 9780780352902 |
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تدمد: | 10636854 |
DOI: | 10.1109/ISPSD.1999.764093 |