دورية أكاديمية
Direct Deembedding of Noise Factors for On-Wafer Noise Measurement
| العنوان: | Direct Deembedding of Noise Factors for On-Wafer Noise Measurement |
|---|---|
| المؤلفون: | Chen, X., Chen, C., Lee, R., Chen, D.C., Wu, D.Y. |
| المصدر: | IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 65(3):916-922 Mar, 2017 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189480 15579670 |
|---|---|
| DOI: | 10.1109/TMTT.2016.2627555 |