مؤتمر
A study on analyzing and modeling dynamic random access memory power under burn-in test condition
| العنوان: | A study on analyzing and modeling dynamic random access memory power under burn-in test condition |
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| المؤلفون: | Han, C. K., Yoon, I. K., Lim, H. S., Kang, S. M., Kim, J. J., Ru, J. W., Hwang, H. S., Rhee, S. J., Cho, K. Y., Jin, G. Y. |
| المصدر: | 2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) Industrial Engineering and Engineering Management (IEEM), 2016 IEEE International Conference on. :1674-1676 Dec, 2016 |
| Relation: | 2016 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781509036653 9781509036646 |
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| تدمد: | 2157362X |
| DOI: | 10.1109/IEEM.2016.7798162 |