دورية أكاديمية
Performance and Variations Induced by Single Interface Trap of Nanowire FETs at 7-nm Node
| العنوان: | Performance and Variations Induced by Single Interface Trap of Nanowire FETs at 7-nm Node |
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| المؤلفون: | Yoon, J., Kim, K., Rim, T., Baek, C. |
| المصدر: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 64(2):339-345 Feb, 2017 |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | تدمد: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2016.2633970 |