Measuring error-tolerance in SRAM architecture on hardware accelerated neural network

التفاصيل البيبلوغرافية
العنوان:	Measuring error-tolerance in SRAM architecture on hardware accelerated neural network
المؤلفون:	Kwon, Sangheon, Lee, Kyungmin, Kim, Yoonsoo, Kim, Kyungah, Lee, Changmin, Ro, Won Woo
المصدر:	2016 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia) Consumer Electronics-Asia (ICCE-Asia), IEEE International Conference on. :1-4 Oct, 2016
Relation:	2016 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia)
قاعدة البيانات:	IEEE Xplore Digital Library

الوصف
ردمك:	9781509027439
DOI:	10.1109/ICCE-Asia.2016.7804818