مؤتمر
Measuring error-tolerance in SRAM architecture on hardware accelerated neural network
العنوان: | Measuring error-tolerance in SRAM architecture on hardware accelerated neural network |
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المؤلفون: | Kwon, Sangheon, Lee, Kyungmin, Kim, Yoonsoo, Kim, Kyungah, Lee, Changmin, Ro, Won Woo |
المصدر: | 2016 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia) Consumer Electronics-Asia (ICCE-Asia), IEEE International Conference on. :1-4 Oct, 2016 |
Relation: | 2016 IEEE International Conference on Consumer Electronics-Asia (ICCE-Asia) |
قاعدة البيانات: | IEEE Xplore Digital Library |
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