BSIM3v3 based degradation compact model for circuit simulation of non-volatile flash memories

التفاصيل البيبلوغرافية
العنوان:	BSIM3v3 based degradation compact model for circuit simulation of non-volatile flash memories
المؤلفون:	Schuler, F., Kowarik, O., Hoffmann, K.
المصدر:	ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.98EX187) Semiconductor electronics Semiconductor Electronics, 1998. Proceedings. ICSE '98. 1998 IEEE International Conference on. :100-104 1998
Relation:	Proceedings ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings
قاعدة البيانات:	IEEE Xplore Digital Library

الوصف
ردمك:	0780349717 9780780349711
DOI:	10.1109/SMELEC.1998.781158