مؤتمر
BSIM3v3 based degradation compact model for circuit simulation of non-volatile flash memories
العنوان: | BSIM3v3 based degradation compact model for circuit simulation of non-volatile flash memories |
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المؤلفون: | Schuler, F., Kowarik, O., Hoffmann, K. |
المصدر: | ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings (Cat. No.98EX187) Semiconductor electronics Semiconductor Electronics, 1998. Proceedings. ICSE '98. 1998 IEEE International Conference on. :100-104 1998 |
Relation: | Proceedings ICSE'98. 1998 IEEE International Conference on Semiconductor Electronics. Proceedings |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 0780349717 9780780349711 |
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DOI: | 10.1109/SMELEC.1998.781158 |