مؤتمر
A DMA and CACHE-based stress schema for burn-in of automotive microcontroller
| العنوان: | A DMA and CACHE-based stress schema for burn-in of automotive microcontroller |
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| المؤلفون: | Bernardi, P., Cantoro, R., Gianotto, L., Restifo, M., Sanchez, E., Venini, F., Appello, D. |
| المصدر: | 2017 18th IEEE Latin American Test Symposium (LATS) Test Symposium (LATS), 2017 18th IEEE Latin American. :1-6 Mar, 2017 |
| Relation: | 2017 18th IEEE Latin American Test Symposium (LATS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781538604151 |
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| DOI: | 10.1109/LATW.2017.7906767 |