التفاصيل البيبلوغرافية
| العنوان: |
Materials screening workflow methodologies for metal oxides and chalcogenides for use in novel devices |
| المؤلفون: |
Chiang, Tony, Littau, Karl, Weeks, Stephen L., Pal, Ashish, Narasimhan, Vijay, Nowling, Greg, Bowes, Michael, Barabash, Sergey V., Pramanik, Dipankar |
| المصدر: |
2017 China Semiconductor Technology International Conference (CSTIC) Semiconductor Technology International Conference (CSTIC), 2017 China. :1-4 Mar, 2017 |
| Relation: |
2017 China Semiconductor Technology International Conference (CSTIC) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
Full Text Finder