التفاصيل البيبلوغرافية
العنوان: |
Suppression of the forward degradation in 4H-SiC PiN diodes by employing a recombination-enhanced buffer layer |
المؤلفون: |
Tawara, Takeshi, Miyazawa, Tetsuya, Ryo, Mina, Miyazato, Masaki, Fujimoto, Takumi, Takenaka, Kensuke, Matsunaga, Shinichiro, Miyajima, Masaaki, Otsuki, Akihiro, Yonezawa, Yoshiyuki, Kato, Tomohisa, Okumura, Hajime, Kimoto, Tsunenobu, Tsuchida, Hidekazu |
المصدر: |
2016 European Conference on Silicon Carbide & Related Materials (ECSCRM) Silicon Carbide & Related Materials (ECSCRM), European Conference on. :1-1 Sep, 2016 |
Relation: |
2016 European Conference on Silicon Carbide & Related Materials (ECSCRM) |
قاعدة البيانات: |
IEEE Xplore Digital Library |