مؤتمر
Impact of BTI on dynamic and static power: From the physical to circuit level
العنوان: | Impact of BTI on dynamic and static power: From the physical to circuit level |
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المؤلفون: | Amrouch, Hussam, Mishra, Subrat, van Santen, Victor, Mahapatra, Souvik, Henkel, Jorg |
المصدر: | 2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :CR-3.1-CR-3.6 Apr, 2017 |
Relation: | 2017 IEEE International Reliability Physics Symposium (IRPS) |
قاعدة البيانات: | IEEE Xplore Digital Library |
ردمك: | 9781509066414 |
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تدمد: | 19381891 |
DOI: | 10.1109/IRPS.2017.7936352 |