التفاصيل البيبلوغرافية
| العنوان: |
Defect-based compact modeling for RTN and BTI variability |
| المؤلفون: |
Weckx, P., Simicic, M., Nomoto, K., Ono, M., Parvais, B., Kaczer, B., Raghavan, P., Linten, D., Sawada, K., Ammo, H., Yamakawa, S., Spessot, A, Verkest, D., Mocuta, Anda |
| المصدر: |
2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :CR-7.1-CR-7.6 Apr, 2017 |
| Relation: |
2017 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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