مؤتمر
Evidence of mechanical degradation in microelectromechanical switches subjected to long-term stresses
| العنوان: | Evidence of mechanical degradation in microelectromechanical switches subjected to long-term stresses |
|---|---|
| المؤلفون: | Barbato, M., Mulloni, V., Barbato, A., Silvestrini, M., Cester, A., Meneghesso, G. |
| المصدر: | 2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :PA-1.1-PA-1.5 Apr, 2017 |
| Relation: | 2017 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781509066414 |
|---|---|
| تدمد: | 19381891 |
| DOI: | 10.1109/IRPS.2017.7936380 |