مؤتمر
Electromigration behavior in aluminum wires for power base-station applications
| العنوان: | Electromigration behavior in aluminum wires for power base-station applications |
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| المؤلفون: | van der Wel, Paul J., Otte, Rik, Roberts, Harry, de Bruijn, Frank, van Zuijlen, Albert, Merkus, Ben |
| المصدر: | 2017 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS),2017 IEEE International. :PA-2.1-PA-2.5 Apr, 2017 |
| Relation: | 2017 IEEE International Reliability Physics Symposium (IRPS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781509066414 |
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| تدمد: | 19381891 |
| DOI: | 10.1109/IRPS.2017.7936381 |