التفاصيل البيبلوغرافية
| العنوان: |
TCAD-based characterization of logic cells: Power, performance, area, and variability |
| المؤلفون: |
Karner, H.W., Kernstock, C., Stanojevic, Z., Baumgartner, O., Schanovsky, F., Karner, M., Helms, D., Eilers, R., Metzdorf, M. |
| المصدر: |
2017 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) VLSI Technology, Systems and Application (VLSI-TSA), 2017 International Symposium on. :1-2 Apr, 2017 |
| Relation: |
2017 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) |
| قاعدة البيانات: |
IEEE Xplore Digital Library |
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