التفاصيل البيبلوغرافية
العنوان: |
TCAD-based characterization of logic cells: Power, performance, area, and variability |
المؤلفون: |
Karner, H.W., Kernstock, C., Stanojevic, Z., Baumgartner, O., Schanovsky, F., Karner, M., Helms, D., Eilers, R., Metzdorf, M. |
المصدر: |
2017 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) VLSI Technology, Systems and Application (VLSI-TSA), 2017 International Symposium on. :1-2 Apr, 2017 |
Relation: |
2017 International Symposium on VLSI Technology, Systems and Application (VLSI-TSA) |
قاعدة البيانات: |
IEEE Xplore Digital Library |