مؤتمر
Analysis of break-even time for nonvolatile SRAM with SOTB technology
| العنوان: | Analysis of break-even time for nonvolatile SRAM with SOTB technology |
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| المؤلفون: | Kitagata, Daiki, Shuto, Yusuke, Yamamoto, Shuu'ichirou, Sugahara, Satoshi |
| المصدر: | 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2017 IEEE. :72-74 Feb, 2017 |
| Relation: | 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781509046607 |
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| DOI: | 10.1109/EDTM.2017.7947511 |