مؤتمر
Analysis of break-even time for nonvolatile SRAM with SOTB technology
العنوان: | Analysis of break-even time for nonvolatile SRAM with SOTB technology |
---|---|
المؤلفون: | Kitagata, Daiki, Shuto, Yusuke, Yamamoto, Shuu'ichirou, Sugahara, Satoshi |
المصدر: | 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) Electron Devices Technology and Manufacturing Conference (EDTM), 2017 IEEE. :72-74 Feb, 2017 |
Relation: | 2017 IEEE Electron Devices Technology and Manufacturing Conference (EDTM) |
قاعدة البيانات: | IEEE Xplore Digital Library |
كن أول من يترك تعليقا!