Test structures for understanding the impact of ultra-high vacuum metal deposition on top-gate MoS2 field-effect-transistors

التفاصيل البيبلوغرافية
العنوان:	Test structures for understanding the impact of ultra-high vacuum metal deposition on top-gate MoS2 field-effect-transistors
المؤلفون:	Bolshakov, Pavel, Zhao, Peng, Smyth, Christopher M., Azcatl, Angelica, Wallace, Robert M., Young, Chadwin D., Hurley, Paul K.
المصدر:	2017 International Conference of Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2017 International Conference of. :1-4 Mar, 2017
Relation:	2017 International Conference of Microelectronic Test Structures (ICMTS)
قاعدة البيانات:	IEEE Xplore Digital Library