مؤتمر
Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions
| العنوان: | Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions |
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| المؤلفون: | Karel, Amit, Azais, Florence, Comte, Mariane, Galliere, Jean-Marc, Renovell, Michel, Singh, Keshav |
| المصدر: | 2017 22nd IEEE European Test Symposium (ETS) Test Symposium (ETS), 2017 22nd IEEE. :1-2 May, 2017 |
| Relation: | 2017 22nd IEEE European Test Symposium (ETS) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781509054572 |
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| تدمد: | 15581780 |
| DOI: | 10.1109/ETS.2017.7968208 |