مؤتمر
Total ionizing dose effects on CMOS devices in a 110 nm technology
| العنوان: | Total ionizing dose effects on CMOS devices in a 110 nm technology |
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| المؤلفون: | Riceputi, Elisa, Gaioni, Luigi, Manghisoni, Massimo, Re, Valerio, Dinapoli, Roberto, Mozzanica, Aldo |
| المصدر: | 2017 13th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) Ph.D. Research in Microelectronics and Electronics (PRIME), 2017 13th Conference on. :241-244 Jun, 2017 |
| Relation: | 2017 13th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 9781509065080 9781509065073 |
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| DOI: | 10.1109/PRIME.2017.7974152 |