مؤتمر
Haystack syndrome avoidance on massive correlation for probe vs. E-test data through the concurrent use of tree base models and trellis graphics. Application on sub-micron mix-signal product for the determination of the best process conditions for yield maximisation
| العنوان: | Haystack syndrome avoidance on massive correlation for probe vs. E-test data through the concurrent use of tree base models and trellis graphics. Application on sub-micron mix-signal product for the determination of the best process conditions for yield maximisation |
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| المؤلفون: | Ortega, C., Ignacio Alonso, J., Sobrino, E., Bonal, J. |
| المصدر: | 10th Annual IEEE/SEMI. Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings (Cat. No.99CH36295) Semiconductor manufacturing 99 Advanced Semiconductor Manufacturing Conference and Workshop, 1999 IEEE/SEMI. :76-79 1999 |
| Relation: | 1999 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 99 Proceedings |
| قاعدة البيانات: | IEEE Xplore Digital Library |
Full Text Finder | ردمك: | 0780352173 9780780352179 |
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| تدمد: | 10788743 |
| DOI: | 10.1109/ASMC.1999.798185 |