Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology

التفاصيل البيبلوغرافية
العنوان:	Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology
المؤلفون:	Karel, Amit, Azais, Florence, Comte, Mariane, Galliere, Jean-Marc, Renovell, Michel, Singh, Keshav
المصدر:	2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI) ISVLSI VLSI (ISVLSI), 2017 IEEE Computer Society Annual Symposium on. :320-325 Jul, 2017
Relation:	2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI)
قاعدة البيانات:	IEEE Xplore Digital Library