Epoxy molding compound effect on fan-out wafer level package strength during post-mold thermal process

التفاصيل البيبلوغرافية
العنوان: Epoxy molding compound effect on fan-out wafer level package strength during post-mold thermal process
المؤلفون: Xu, Cheng, Zhong, Z. W., Choi, W. K.
المصدر: 2017 16th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm) Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2017 16th IEEE Intersociety Conference on. :1388-1392 May, 2017
Relation: 2017 16th IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)
قاعدة البيانات: IEEE Xplore Digital Library
الوصف
ردمك:9781509029945
9781509029938
DOI:10.1109/ITHERM.2017.7992643